• DocumentCode
    3051364
  • Title

    Water treeing characterization and tree retardant compound effects in XLPE power cables

  • Author

    Miller, M.L. ; Gorur, R.S. ; Hendrickson, L.E. ; Dyer, M.L.

  • Author_Institution
    Arizona State Univ., Tempe, AZ, USA
  • fYear
    1990
  • fDate
    28-31 Oct 1990
  • Firstpage
    404
  • Lastpage
    409
  • Abstract
    The authors describe experimentation done in establishing techniques for laboratory growth and analytical characterization of water trees. Techniques used include scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy dispersive X-ray spectroscopy, and Fourier transform infrared spectroscopy (FTIR). Measurements of electrical properties such as capacitance, dissipation factor, and leakage current were made, but no significant differences between the virgin, field aged, and treed samples were measured. SEM and TEM techniques do indicate differences between virgin, field-aged, and vented tree cross-linked polyethylene (XLPE) samples. The FTIR technique shows that the tree retardant compound (TRC) may change the composition of the tree region. Preliminary results of characterization of virgin, field aged (without trees), and treed XLPE samples with and without treatment with the TRC are presented
  • Keywords
    Fourier transform spectra; X-ray chemical analysis; cable insulation; electric breakdown of solids; organic insulating materials; polymers; power cables; scanning electron microscope examination of materials; transmission electron microscope examination of materials; FTIR; Fourier transform infrared spectroscopy; SEM; TEM; XLPE; analytical characterization; capacitance; cross-linked polyethylene; dissipation factor; electrical properties; energy dispersive X-ray spectroscopy; field aged cables; laboratory growth; leakage current; power cables; scanning electron microscopy; transmission electron microscopy; tree retardant compound effects; water trees; Aging; Capacitance measurement; Current measurement; Dispersion; Electric variables measurement; Retardants; Scanning electron microscopy; Spectroscopy; Transmission electron microscopy; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1990.201375
  • Filename
    201375