DocumentCode :
3051431
Title :
Fabrication Process of Carbon Nanotube FETs Using ALD Passivation for Biosensors
Author :
Nakashima, Y. ; Ohno, Y. ; Kishimoto, S. ; Okochi, M. ; Honda, H. ; Mizutani, T.
Author_Institution :
Nagoya Univ., Nagoya
fYear :
2007
fDate :
5-8 Nov. 2007
Firstpage :
488
Lastpage :
489
Abstract :
In this study, we have applied atomic layer deposition (ALD) for the fabrication of CNT-FET biosensors.Biosensor operation was confirmed by CNT-FETs fabricated using the ALD passivation film. CNTs were grown on a SiO2(100 nm)/p+-Si substrate by alcohol catalytic chemical vapor deposition. Following the fabrication of the CNT-FETs, HfO2 film (50 nm) with a large dielectric constant was deposited on the device surface by ALD at 250degC. HfO2 was chosen as a passivation/top-gate insulator to realize a large transconductance of the device. SEM image of the HfO2-deposited sample, indicates that the step coverage is very good in the case of the ALD. The devices with the top gate were used for biosensors. The self-assembled-monolayer (SAM) film with carboxyl group was formed on the top-gate FET surface by immersing the device in 3-Mercaptopropionic acid. Biosensor measurement was performed by measuring the ID when the enzyme Cytochrome c (pl= 10.25, 2.7mg/ml) containing solution was dropped into the phosphate-buffer (PB) solution (pH=7.0) where the SAM-coated device was immersed. Thus we have successfully fabricated CNT-FET biosensors using ALD HfO2 as a passivation film with little degradation of the ID.
Keywords :
atomic layer deposition; biosensors; carbon nanotubes; chemical vapour deposition; enzymes; field effect transistors; hafnium compounds; leakage currents; monolayers; passivation; permittivity; scanning electron microscopy; self-assembly; silicon compounds; 3-Mercaptopropionic acid; FETs; HfO2; SEM image; Si; SiO2; atomic layer deposition; back-gate electrode; biosensor; carbon nanotube; chemical vapor deposition; dielectric constant; enzyme Cytochrome c; leakage current; passivation film; self-assembled-monolayer film; size 50 nm; temperature 250 C; top-gate electrode formation; Atomic layer deposition; Biosensors; Chemical vapor deposition; Dielectric constant; Dielectric substrates; Dielectrics and electrical insulation; Fabrication; Hafnium oxide; Passivation; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology, 2007 Digest of papers
Conference_Location :
Kyoto
Print_ISBN :
978-4-9902472-4-9
Type :
conf
DOI :
10.1109/IMNC.2007.4456317
Filename :
4456317
Link To Document :
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