Title :
Circuit Response of GaAs MMICs and Bias Networks to Ionizing Radiation Transients
Author :
Beall, J.M. ; Anderson, W.T.
Author_Institution :
Texas Instruments, Inc. and the Naval Research Laboratory
Abstract :
Measurements indicate that radiation induced currents in GaAs MMIC microstrip circuitry are the principal cause of a transient upset in performance. Currents were observed at both Schottky and Ohmic contacts, while MIM structures remained insulating.
Keywords :
Bonding; Capacitors; FETs; Feedback amplifiers; Feedback circuits; Gallium arsenide; Ionizing radiation; MMICs; Microstrip; Ohmic contacts;
Conference_Titel :
Military Communications Conference - Communications-Computers: Teamed for the 90's, 1986. MILCOM 1986. IEEE
DOI :
10.1109/MILCOM.1986.4805827
