Title :
A novel Bayesian method for fitting parametric and non-parametric models to noisy data
Author :
Werman, Michael ; Keren, Daniel
Author_Institution :
Inst. of Comput. Sci., Hebrew Univ., Jerusalem, Israel
Abstract :
We offer a simple paradigm for fitting models, parametric and non-parametric, to noisy data, which resolves some of the problems associated with classic MSE algorithms. This is done by considering each point on the model as a possible source for each data point. The paradigm also allows to solve problems which are not defined in the classical MSE approach, such as fitting a segment (as opposed to a line). It is shown to be non-biased, and to achieve excellent results for general curves, even in the presence of strong discontinuities. Results are shown for a number of fitting problems, including lines, circles, segments, and general curves, contaminated by Gaussian and uniform noise
Keywords :
Bayes methods; computational geometry; image processing; Bayesian method; Gaussian noise; MSE algorithms; circles; discontinuities; lines; noisy data; nonparametric models fitting; parametric models fitting; segments; uniform noise; Bayesian methods; Computer science; Curve fitting; Gaussian noise; Least squares approximation; Linear approximation; Mean square error methods; Parametric statistics; Polynomials; Surface fitting;
Conference_Titel :
Computer Vision and Pattern Recognition, 1999. IEEE Computer Society Conference on.
Conference_Location :
Fort Collins, CO
Print_ISBN :
0-7695-0149-4
DOI :
10.1109/CVPR.1999.784964