Electroluminescence and electrical tree inception at an XLPE-semicon interface

Author

Matsuki, M. ; Bamji, S.S. ; Bulinski, A.T. ; Densley, R.J.

Author_Institution

Furukawa Electr. Co. Ltd., Tokyo, Japan

fYear

1990

fDate

28-31 Oct 1990

Firstpage

486

Lastpage

493

Abstract

The characteristics of EL (electroluminescence) at a semiconductor protrusion embedded in XLPE (cross-linked polyethylene) were studied for specimens containing different gases in their free volume. The spectra of EL and the tree inception voltage (TIV) of normal XLPE, containing air, are compared to those of degassed and N₂-impregnated polymer. The TIV of normal specimens, containing air, was lower than that of degassed or N₂-impregnated polymer. The results indicate that at room temperature the tree initiation mechanisms at a XLPE-semiconductor interface and at a metallic needle embedded in LDPE (low-density polyethylene) are similar and suggest that oxygen present in the free volume of the polymeric insulation could play an important role in the deterioration of XLPE insulation subjected to high electrical stress

Keywords

cable insulation; electric breakdown of solids; electroluminescence; interface phenomena; organic insulating materials; polymers; power cables; semiconductor-insulator boundaries; N₂-impregnated polymer; XLPE insulation; XLPE-semiconductor interface; cross-linked polyethylene; degassed polymer; electrical tree inception; electroluminescence; high electrical stress; low-density polyethylene; metallic needle; polymeric insulation; semiconductor protrusion; tree inception voltage; tree initiation mechanisms; Dielectrics and electrical insulation; Electroluminescence; Gases; Needles; Plastic insulation; Polyethylene; Polymers; Temperature; Trees - insulation; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on

Conference_Location

Pocono Manor, PA

Type

conf

DOI

10.1109/CEIDP.1990.201386

Filename

201386