Title :
High-power and highly-reliable operation of 0.98-μm lasers with an exponential-shaped flared stripe
Author :
Sagawa, M. ; Hiramoto, K. ; Toyonaka, T. ; Kikawa, T. ; Uomi, K.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
A 0.98 μm InGaAs/InGaAsP/GaAs strained-quantum-well laser with an exponential-shaped-flared stripe was studied. Its maximum output power with the same kink-occurrence output power was 40-60 % higher than that of ordinary straight-stripe lasers. A 150-mW lifetest showed the stable operation with an estimated lifetime of more than 200,000 hours
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser reliability; laser transitions; life testing; quantum well lasers; 0.98 mum; 0.98-μm lasers; 150 mW; 150-mW lifetest; 200000 hour; InGaAs-InGaAsP-GaAs; InGaAs/InGaAsP/GaAs strained-quantum-well laser; estimated lifetime; exponential-shaped flared stripe; high-power; highly-reliable operation; kink-occurrence output power; maximum output power; stable operation; Erbium; Fiber lasers; Laser modes; Laser stability; Life estimation; Lifetime estimation; Power generation; Power lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565112
