DocumentCode
3051946
Title
Measuring of emitted photo-electrons from cathode
Author
Sato, S. ; Kojima, A. ; Iijima, N. ; Sone, M. ; Mitsui, H. ; Isono, H.
Author_Institution
Musashi Inst. of Technol., Tokyo, Japan
fYear
1990
fDate
28-31 Oct 1990
Firstpage
618
Lastpage
623
Abstract
A microchannel plate was used to measure the number of emitted photoelectrons from cathodes of Cu, Fe, and Al. The number of photoelectrons is shown to differ according to wavelength. Also, there is a difference in the number of photoelectrons between samples. Even in sample cathodes of the same material, there is a difference in the number of the photoelectrons. The differences in the number of photoelectrons are ranked as follows: Cu>Fe>Al. The number of photoelectrons changes according to the breakdown treatment. It is noted that it is difficult to change the number of the emitted photoelectrons according to the current of the light source
Keywords
aluminium; copper; image intensifiers; iron; photocathodes; photoemission; Al; Cu; Fe; breakdown treatment; cathodes; emitted photoelectrons; light source; microchannel plate; Aluminum; Cathodes; Copper; Electric breakdown; Electrodes; Electron emission; Gas insulation; Iron; Light sources; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1990. Annual Report., Conference on
Conference_Location
Pocono Manor, PA
Type
conf
DOI
10.1109/CEIDP.1990.201406
Filename
201406
Link To Document