Title :
Growth and orientation of GaN epilayers on NdGaO3 by hydride vapor phase epitaxy
Author :
Wakahara, Akihiro ; Nishida, Teruaki ; Kawano, Kenji ; Yoshida, Akira ; Seki, Youji ; Oda, Osamu
Author_Institution :
Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Japan
Abstract :
Growth characteristics of GaN on NdGaO3 (011) and (101) substrates by hydride vapor phase epitaxy are investigated. The epitaxial relationship is found to be GaN(0001)/NdGaO3 (011) with GaN [10-10]//NdGaO3 [100] for NdGaO3 (011) and GaN(11-24)/NdGaO3(101) with GaN[11-2-4]//NdGaO3 [10-1] for the NdGaO3 (101). When the GaN is directly grown on NdGaO3substrates around 1000°C, no deposits of GaN are obtained due to the reduction of the NdGaO3s substrate by the presence of NH3 at high temperature. In order to avoid the substrate reduction, low-temperature grown GaN is effective as the protective layer
Keywords :
III-V semiconductors; gallium compounds; reflection high energy electron diffraction; semiconductor epitaxial layers; semiconductor growth; surface structure; vapour phase epitaxial growth; wide band gap semiconductors; NdGaO3 substrates; RHEED; SiC; epilayers; hydride vapor phase epitaxy; protective layer; Atomic force microscopy; Atomic layer deposition; Diode lasers; Epitaxial growth; Gallium nitride; Lattices; Optical materials; Substrates; Surface morphology; Temperature;
Conference_Titel :
Semiconducting and Insulating Materials, 1998. (SIMC-X) Proceedings of the 10th Conference on
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-4354-9
DOI :
10.1109/SIM.1998.785071