Thermal impedance measurements in vertical-cavity lasers

Author

Wipiejewski, T. ; Young, D.B. ; Coldren, L.A. ; Ebeling, K.J.

Author_Institution

Dept. of Optoelectron., Ulm Univ., Germany

Volume

1

fYear

1996

fDate

18-21 Nov. 1996

Firstpage

148

Abstract

Summary form only given. In summary, we have measured the thermal impedance of unmounted InGaAs QW vertical-cavity lasers. The time constant of the thermal chirp for laser elements is in the order of a few microseconds and increases with device diameter. The varying device temperature should be considered as a source of pattern effects in datacom applications.

Keywords

crosstalk; gallium arsenide; indium compounds; laser cavity resonators; laser modes; optical testing; optical transmitters; quantum well lasers; semiconductor device testing; semiconductor laser arrays; surface emitting lasers; DBR lasers; InGaAs; datacom applications; device diameter; laser elements; optical transmitters; pattern effects; thermal chirp; thermal impedance measurements; time constant; unmounted InGaAs QW vertical-cavity lasers; varying device temperature; vertical-cavity lasers; Crosstalk; Distributed Bragg reflectors; Etching; Impedance measurement; Optical pulses; Power lasers; Surface emitting lasers; Temperature; Vertical cavity surface emitting lasers; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE

Conference_Location

Boston, MA, USA

Print_ISBN

0-7803-3160-5

Type

conf

DOI

10.1109/LEOS.1996.565168

Filename

565168