Title :
Vacancies in low-temperature-grown GaAs: observations by positron annihilation
Author :
Gebauer, J. ; Borner, F. ; Krause-Rehberg, R. ; Specht, P. ; Weber, E.R.
Author_Institution :
Fachbereich Phys., Martin-Luther-Univ., Halle-Wittenberg, Germany
Abstract :
Positron annihilation will be used to study vacancy defects in GaAs grown at low temperatures (LT-GaAs), the vacancies in as-grown LT-GaAs can be identified to be Ga monovacancies, VGa, the density of VGa is related to the nonstoichiometry in LT-GaAs, established by decreasing the growth temperature or increasing the As/Ga beam equivalent pressure (BEP) ratio, a maximum of about 2×1018 VGa/cm3 was observed at the lowest growth temperature (200°C), annealing at elevated temperatures (≈600°C) removes VGa, instead, larger vacancy agglomerates are found, they are most likely associated with the As-precipitates commonly found in annealed LT-GaAs
Keywords :
III-V semiconductors; annealing; gallium arsenide; positron annihilation; precipitation; stoichiometry; vacancies (crystal); 200 C; 600 C; As-precipitates; As/Ga beam equivalent pressure; Ga monovacancies; GaAs; annealing; as-grown LT-GaAs; growth temperature; low temperatures; low-temperature-grown GaAs; nonstoichiometry; positron annihilation; vacancies; vacancy agglomerates; vacancy defects; Annealing; Gallium arsenide; Laboratories; Lattices; Molecular beam epitaxial growth; Positrons; Scattering parameters; Spectroscopy; Temperature; Virtual manufacturing;
Conference_Titel :
Semiconducting and Insulating Materials, 1998. (SIMC-X) Proceedings of the 10th Conference on
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-4354-9
DOI :
10.1109/SIM.1998.785089