• DocumentCode
    3052329
  • Title

    Improvement in high-temperature dielectric properties of epoxy resin by abundant addition of micro-silica

  • Author

    Hyuga, Mayumi ; Tagami, Naoki ; Tanaka, Toshikatsu ; Ohki, Yoshimichi ; Imai, Takahiro ; Harada, Miyuki ; Ochi, Mitsukazu

  • Author_Institution
    Dept. of EEBS, Waseda Univ., Shinjuku, Japan
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    519
  • Lastpage
    522
  • Abstract
    Effects of addition of micro-sized silica fillers and/or nano-sized clay fillers into epoxy resin on its dielectric properties were examined. The glass transition intermediate temperature (Tg) was found to show a decrease by the addition of a small amount of nanofillers, while it is increased by the addition of abundant microfillers with and without co-addition of a small amount of nanofillers. At temperatures above Tg, the samples with abundant microfillers were added have low conductivity, low dielectric constant, and low dielectric loss factor regardless of the co-addition of nanofillers.
  • Keywords
    clay; dielectric losses; electrical conductivity; filled polymers; glass transition; permittivity; resins; silicon compounds; SiO2; conductivity; dielectric constant; dielectric loss factor; epoxy resin; glass transition intermediate temperature; high-temperature dielectric property; microsized silica fillers; nanosized clay fillers; Conductivity measurement; Current measurement; Dielectric measurements; Electric variables measurement; Epoxy resins; Frequency measurement; Impedance measurement; Polymers; Silicon compounds; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
  • Conference_Location
    Virginia Beach, VA
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-4557-8
  • Electronic_ISBN
    0084-9162
  • Type

    conf

  • DOI
    10.1109/CEIDP.2009.5377845
  • Filename
    5377845