DocumentCode :
3052329
Title :
Improvement in high-temperature dielectric properties of epoxy resin by abundant addition of micro-silica
Author :
Hyuga, Mayumi ; Tagami, Naoki ; Tanaka, Toshikatsu ; Ohki, Yoshimichi ; Imai, Takahiro ; Harada, Miyuki ; Ochi, Mitsukazu
Author_Institution :
Dept. of EEBS, Waseda Univ., Shinjuku, Japan
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
519
Lastpage :
522
Abstract :
Effects of addition of micro-sized silica fillers and/or nano-sized clay fillers into epoxy resin on its dielectric properties were examined. The glass transition intermediate temperature (Tg) was found to show a decrease by the addition of a small amount of nanofillers, while it is increased by the addition of abundant microfillers with and without co-addition of a small amount of nanofillers. At temperatures above Tg, the samples with abundant microfillers were added have low conductivity, low dielectric constant, and low dielectric loss factor regardless of the co-addition of nanofillers.
Keywords :
clay; dielectric losses; electrical conductivity; filled polymers; glass transition; permittivity; resins; silicon compounds; SiO2; conductivity; dielectric constant; dielectric loss factor; epoxy resin; glass transition intermediate temperature; high-temperature dielectric property; microsized silica fillers; nanosized clay fillers; Conductivity measurement; Current measurement; Dielectric measurements; Electric variables measurement; Epoxy resins; Frequency measurement; Impedance measurement; Polymers; Silicon compounds; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
ISSN :
0084-9162
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2009.5377845
Filename :
5377845
Link To Document :
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