DocumentCode
305241
Title
Single quantum dot spectroscopy
Author
Gammon, D. ; Snow, E.S. ; Shanabrook, B.V. ; Brown, S.W. ; Kennedy, T.A. ; Katzer, D.S. ; Park, D.
Author_Institution
Naval Res. Lab., Washington, DC, USA
Volume
1
fYear
1996
fDate
18-21 Nov. 1996
Firstpage
174
Abstract
Semiconductor quantum dots localize the exciton in all three spatial dimensions and completely quantize the exciton energy spectrum. In the past, experimental studies of quantum dots have been severely hampered by large fluctuations in the dot size which leads to large inhomogeneous broadening in the optical spectra. To avoid this problem, we have developed the capability to measure the photoluminescence (PL) spectra of single quantum dots which are formed naturally from the monolayer-sized interface fluctuations in a thin GaAs/AlGaAs quantum well. This is accomplished by reducing the laser spot size through the use of apertures patterned in an Al mask evaporated directly on the sample surface. By exciting and detecting through a single aperture we obtain PL spectra in which each spectrum is composed of quantum PL lines, the number of which is reduced by going to smaller apertures.
Keywords
III-V semiconductors; aluminium compounds; excitons; gallium arsenide; photoluminescence; semiconductor quantum dots; spectral line broadening; Al; Al mask; GaAs-AlGaAs; apertures; dot size; exciton; exciton energy spectrum; large inhomogeneous broadening; laser spot size; monolayer-sized interface fluctuations; optical spectra; photoluminescence spectra; quantum PL lines; semiconductor quantum dots; single aperture; single quantum dot spectroscopy; spatial dimensions; thin GaAs/AlGaAs quantum well; Apertures; Excitons; Fluctuations; Gallium arsenide; Photoluminescence; Quantum dot lasers; Quantum dots; Quantum well lasers; Spectroscopy; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-3160-5
Type
conf
DOI
10.1109/LEOS.1996.565181
Filename
565181
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