Title :
Near-field Raman spectra: surface enhancement, z-polarization, fiber Raman background and Rayleigh scattering
Author :
Jahncke, C.L. ; Hallen, H.D.
Author_Institution :
Dept. of Phys., North Carolina State Univ., Raleigh, NC, USA
Abstract :
Near-field optical microscopy (NSOM) is a technique that offers several advantages over conventional optical microscopy. We present evidence for a z-polarization component and a surface-enhancement effect in near-field Raman data. Observation of Raman scattering from the fiber probe and Rayleigh scattering may be used to determine probe quality. The sample studied is KTiOPO/sub 4/ (KTP) a nonlinear optical material, for which a comparison of near-field and far-field spectra is shown.
Keywords :
Raman spectra; Raman spectroscopy; Rayleigh scattering; light polarisation; optical fibres; optical microscopy; potassium compounds; titanium compounds; KTiOPO/sub 4/; NSOM; Rayleigh scattering; far-field spectra; fiber Raman background; fiber probe; near-field Raman spectra; near-field optical microscopy; nonlinear optical material; probe quality; surface enhancement; surface-enhancement effect; z-polarization; Apertures; Light scattering; Optical fiber polarization; Optical microscopy; Optical scattering; Probes; Raman scattering; Rayleigh scattering; Spectroscopy; Surface topography;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565182
