DocumentCode :
3052453
Title :
Integral equation method for the computation of PD inception voltage in voids
Author :
Huang, Yeqin ; Burbank, Kenneth ; Zhang, James Z.
Author_Institution :
Dept. of Eng. & Technol., Western Carolina Univ., Cullowhee, NC, USA
fYear :
2009
fDate :
18-21 Oct. 2009
Firstpage :
565
Lastpage :
568
Abstract :
The presence of voids in insulation materials has deleterious effects on the electrical performance of insulation, and eventually cause breakdown of the insulation. Understanding the physics of partial discharge is a major field of research for the interpretation and identification of insulation defects. The integral equation method presented in this paper provides a general approach to computations of electric stress in dielectrics with voids. The applications of the method are illustrated by computations of the maximum electric stress and inception voltage for voids of various shapes. The method presented in this paper allows us to analyze the electric stress in dielectrics with voids, and thus to make assessment of the risk of insulation breakdown.
Keywords :
insulating materials; integral equations; partial discharges; risk analysis; voids (solid); electric insulation breakdown; electric stress computations; inception voltage; insulation defect identification; insulation materials; integral equation method; partial discharge; risk assessment; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Integral equations; Partial discharges; Physics; Risk analysis; Shape; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2009. CEIDP '09. IEEE Conference on
Conference_Location :
Virginia Beach, VA
ISSN :
0084-9162
Print_ISBN :
978-1-4244-4557-8
Electronic_ISBN :
0084-9162
Type :
conf
DOI :
10.1109/CEIDP.2009.5377850
Filename :
5377850
Link To Document :
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