• DocumentCode
    3052527
  • Title

    Automatic exposure compensation for line detection applications

  • Author

    Nguyen, Thuy Tuong ; Pham, Xuan Dai ; Kim, Dongkyun ; Jeon, Jae Wook

  • Author_Institution
    Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon
  • fYear
    2008
  • fDate
    20-22 Aug. 2008
  • Firstpage
    68
  • Lastpage
    73
  • Abstract
    The detection of lines in an image is an important task. In spite of the numerous research papers that have been published on line extraction, there is a lack of real-world applications relating to coping with illumination changes in scenes. This paper provides an automatic exposure compensation scheme that transforms images under unknown illumination conditions into images that can be used as the best preprocessing data for line detection. Our method is tested on gray level frames captured from the camera where the exposure parameter is changed continuously. Among these frames, the image with the best contrast is selected based on the image entropy. We then apply contrast stretching to transform this poorly illuminated image into one that has better visibility. Afterwards, the Canny edge detection algorithm is applied to obtain the input for the standard Hough transform, which is the line extraction algorithm. Furthermore, our system detects lines in real-time, so it is suitable for many real-world applications.
  • Keywords
    Hough transforms; cameras; edge detection; feature extraction; Canny edge detection algorithm; automatic exposure compensation scheme; contrast stretching; line detection applications; line extraction algorithm; standard Hough transform; Application software; Cameras; Detectors; Entropy; Image edge detection; Intelligent robots; Layout; Lighting; Neural networks; Power engineering and energy; Canny edge detector; Standard Hough Transform; contrast stretch; exposure compensation; image entropy; line extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multisensor Fusion and Integration for Intelligent Systems, 2008. MFI 2008. IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-2143-5
  • Electronic_ISBN
    978-1-4244-2144-2
  • Type

    conf

  • DOI
    10.1109/MFI.2008.4648110
  • Filename
    4648110