DocumentCode
305263
Title
Measurements in optical information processing
Author
Paek, Emg-Ci ; Watson, Craig I. ; Wilson, Charles L.
Volume
1
fYear
1996
fDate
18-21 Nov. 1996
Abstract
Summary form only given. Recent advances in photonic device technology opens many new opportunities for optical information processing to play an important role in optical information storage, optical information processing, pattern recognition and display. However, a main hurdle of optical information processing is the lack of accuracy and reliability. To overcome this hurdle, accurate test and measurement methods as well as analytical tools must be developed. This talk will focus on various measurement issues at both device and system levels.
Keywords
image recognition; measurement errors; optical information processing; optical storage; optical testing; reliability; accuracy; accurate test; analytical tools; device levels; display; measurement issues; measurement methods; optical information processing measurements; optical information storage; pattern recognition; photonic device technology; reliability; system levels; Displays; Electrooptic devices; Information processing; Optical devices; Optical sensors; Pattern recognition; Photonics; Sensor systems; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-3160-5
Type
conf
DOI
10.1109/LEOS.1996.565210
Filename
565210
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