Measurements in optical information processing

Summary form only given. Recent advances in photonic device technology opens many new opportunities for optical information processing to play an important role in optical information storage, optical information processing, pattern recognition and display. However, a main hurdle of optical information processing is the lack of accuracy and reliability. To overcome this hurdle, accurate test and measurement methods as well as analytical tools must be developed. This talk will focus on various measurement issues at both device and system levels.