DocumentCode :
3052650
Title :
Yield modeling of MCM assembly with flip-chip thermocompression bondings
Author :
Kang, Sa-Yoon ; Lee, Y.C.
Author_Institution :
Dept. of Mech. Eng., Colorado Univ., Boulder, CO, USA
fYear :
1992
fDate :
18-20 Mar 1992
Firstpage :
68
Lastpage :
71
Abstract :
Flip-chip connections using gold-to-gold, gold-to-aluminum, or gold-to-solder bondings or contacts enhanced by epoxy are low-cost alternatives to soldering. A yield model has been developed for flip-chip, thermocompression bondings. The model predicts the assembly yield as a function of forces and planarities of the end effector, bump height variations, bump geometries, mechanical properties corresponding to different materials and temperatures, and distribution patterns of bumps. The model calculates the deformation of each gold bump under different assembly conditions, and determines if the bonding is good, with a 15 to 45% range, or bad
Keywords :
flip-chip devices; lead bonding; modules; Au-Al; Au-Au; Au-PbSn; MCM assembly; MCMs; assembly conditions; assembly yield; bump geometries; bump height; end effector; flip-chip; forces; mechanical properties; multichip modules; planarities; thermocompression bondings; yield model; Assembly; Bonding; End effectors; Geometry; Mechanical factors; Predictive models; Semiconductor device modeling; Soldering; Solid modeling; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multi-Chip Module Conference, 1992. MCMC-92, Proceedings 1992 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-2725-5
Type :
conf
DOI :
10.1109/MCMC.1992.201449
Filename :
201449
Link To Document :
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