DocumentCode
3052672
Title
Automatic Facial Skin Defect Detection System
Author
Chang, Chuan-Yu ; Li, Shang-Cheng ; Chung, Pau-Choo ; Kuo, Jui-Yi ; Tu, Yung-Chin
Author_Institution
Dept. of Comput. Sci. & Inf. Eng., Nat. Yunlin Univ. of Sci. & Technol., Douliu, Taiwan
fYear
2010
fDate
4-6 Nov. 2010
Firstpage
527
Lastpage
532
Abstract
Skin analysis is one of the most important procedures before medical cosmetology. Most conventional skin analysis systems are semi-automatic. They often require human intervention. In this study, an automatic facial skin defect detection approach is proposed. The system first detects human face in the facial image. Based on the detected face, facial features are extracted to locate regions of interest. Then, a pattern recognition approach is applied to detect facial skin defects, such as spots and wrinkles, in the regions of interest. For a specific kind of defect, a classifier is designed to provide higher performance for recognition. Using few features extracted from the region of interest, the proposed approach can successfully detect the skin defects. Experimental results demonstrate effectiveness of the proposed approach.
Keywords
face recognition; feature extraction; image classification; skin; automatic facial skin defect detection system; classifier; facial skin defects detection; feature extraction; human face detection; medical cosmetology; pattern recognition approach; skin analysis; Face; Facial features; Feature extraction; Forehead; Image color analysis; Skin; Transforms; facial skin defect detection; spot; wrinkle;
fLanguage
English
Publisher
ieee
Conference_Titel
Broadband, Wireless Computing, Communication and Applications (BWCCA), 2010 International Conference on
Conference_Location
Fukuoka
Print_ISBN
978-1-4244-8448-5
Electronic_ISBN
978-0-7695-4236-2
Type
conf
DOI
10.1109/BWCCA.2010.126
Filename
5633781
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