DocumentCode :
3052672
Title :
Automatic Facial Skin Defect Detection System
Author :
Chang, Chuan-Yu ; Li, Shang-Cheng ; Chung, Pau-Choo ; Kuo, Jui-Yi ; Tu, Yung-Chin
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Yunlin Univ. of Sci. & Technol., Douliu, Taiwan
fYear :
2010
fDate :
4-6 Nov. 2010
Firstpage :
527
Lastpage :
532
Abstract :
Skin analysis is one of the most important procedures before medical cosmetology. Most conventional skin analysis systems are semi-automatic. They often require human intervention. In this study, an automatic facial skin defect detection approach is proposed. The system first detects human face in the facial image. Based on the detected face, facial features are extracted to locate regions of interest. Then, a pattern recognition approach is applied to detect facial skin defects, such as spots and wrinkles, in the regions of interest. For a specific kind of defect, a classifier is designed to provide higher performance for recognition. Using few features extracted from the region of interest, the proposed approach can successfully detect the skin defects. Experimental results demonstrate effectiveness of the proposed approach.
Keywords :
face recognition; feature extraction; image classification; skin; automatic facial skin defect detection system; classifier; facial skin defects detection; feature extraction; human face detection; medical cosmetology; pattern recognition approach; skin analysis; Face; Facial features; Feature extraction; Forehead; Image color analysis; Skin; Transforms; facial skin defect detection; spot; wrinkle;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Broadband, Wireless Computing, Communication and Applications (BWCCA), 2010 International Conference on
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4244-8448-5
Electronic_ISBN :
978-0-7695-4236-2
Type :
conf
DOI :
10.1109/BWCCA.2010.126
Filename :
5633781
Link To Document :
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