Title :
Near-field scanning optical microscopy as a passive and active (material modification) scientific probe
Author :
Moyer, Patrick J.
Author_Institution :
Dept. of Phys., North Carolina Univ., Charlotte, NC, USA
Abstract :
Summary form only given. We discuss combining photoelectrochemistry techniques with near-field scanning optical microscopy (NSOM). The purpose of these experiments is to study the surface chemistry induced by charge transfer across the solid/liquid interface on an unprecedented length scale (<100 nm).
Keywords :
charge exchange; electrochemistry; optical microscopy; photoelectrochemistry; surface chemistry; 100 nm; NSOM; active scientific probe; charge transfer; material modification; near-field scanning optical microscopy; passive scientific probe; photoelectrochemistry techniques; solid/liquid interface; surface chemistry; Chemistry; Optical materials; Optical microscopy; Solids;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1996. LEOS 96., IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3160-5
DOI :
10.1109/LEOS.1996.565219
