Title :
Temperature-Dependence Measurement of Anisotropic Complex Permittivity for Mic Dielectric Substrate
Author :
Kobayashi, Y. ; Yu, J.
Author_Institution :
Department of Electrical and Electronics Engineering, Saitama University, Japan
Keywords :
Anisotropic magnetoresistance; Copper; Dielectric measurements; Dielectric substrates; Electromagnetic heating; Laminates; Microwave integrated circuits; Permittivity measurement; Surface resistance; Temperature measurement;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672271
