Title :
2008 International conference on simulation of semiconductor processes and devices SISPAD 2008
Abstract :
The following topics were dealt with: fluctuations; memories; noise and reliability; new function devices; boosting performance; transport and mobility; device design; quantum transport; circuit simulation.
Keywords :
circuit simulation; semiconductor device noise; semiconductor device reliability; semiconductor devices; semiconductor process modelling; semiconductor storage; circuit simulation; device design; fluctuations; memories; mobility; noise; performance; quantum transport; reliability; semiconductor devices; semiconductor processes; transport;
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
DOI :
10.1109/SISPAD.2008.4648215
