DocumentCode
3052953
Title
Salvaging test windows in BIST diagnostics
Author
Savir, Jacob
Author_Institution
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear
1997
fDate
27 Apr-1 May 1997
Firstpage
416
Lastpage
425
Abstract
This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveals an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced
Keywords
built-in self test; BIST diagnostics; STUMPS architecture; signature measurement; test window; Built-in self-test; Design methodology; Failure analysis; Fault detection; Fault diagnosis; Jacobian matrices; Logic testing; Registers; Sequential analysis; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location
Monterey, CA
ISSN
1093-0167
Print_ISBN
0-8186-7810-0
Type
conf
DOI
10.1109/VTEST.1997.600321
Filename
600321
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