DocumentCode :
3053049
Title :
Defect filter for alternate RF test
Author :
Stratigopoulos, Haralampos-G ; Mir, Salvador ; Acar, Erkan ; Ozev, Sule
Author_Institution :
TIMA Lab., CNRS-INP Grenoble-UJF, Grenoble, France
fYear :
2010
fDate :
24-28 May 2010
Firstpage :
265
Lastpage :
270
Abstract :
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
Keywords :
circuit testing; filters; alternate RF testing; alternate test flow; defect dictionary; nonlinear defect filter; probability density function; Data mining; Density measurement; Dictionaries; Filtering; Filters; Laboratories; Principal component analysis; Probability density function; Radio frequency; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
ISSN :
1530-1877
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
Type :
conf
DOI :
10.1109/ETSYM.2010.5512726
Filename :
5512726
Link To Document :
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