• DocumentCode
    3053049
  • Title

    Defect filter for alternate RF test

  • Author

    Stratigopoulos, Haralampos-G ; Mir, Salvador ; Acar, Erkan ; Ozev, Sule

  • Author_Institution
    TIMA Lab., CNRS-INP Grenoble-UJF, Grenoble, France
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    265
  • Lastpage
    270
  • Abstract
    Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
  • Keywords
    circuit testing; filters; alternate RF testing; alternate test flow; defect dictionary; nonlinear defect filter; probability density function; Data mining; Density measurement; Dictionaries; Filtering; Filters; Laboratories; Principal component analysis; Probability density function; Radio frequency; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512726
  • Filename
    5512726