Title :
Process tomography of coherent state transfer from light polarization to electron spin polarization in a semiconductor
Author :
Kosaka, Hideo ; Inagaki, Takahiro ; Mitsumori, Yaeko ; Edamatsu, Keiichi
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
fDate :
June 30 2013-July 4 2013
Abstract :
We demonstrate process tomography of coherent state transfer. We estimated process fidelity of the state transfer to be 81% and clarified that the phase-flip error is the major contribution to the fidelity degradation.
Keywords :
electron spin polarisation; light coherence; light polarisation; optical tomography; semiconductor quantum wells; coherent state transfer; electron spin polarization; fidelity degradation; light polarization; phase-flip error; process tomography; semiconductor; Coherence; Electron optics; Magnetic fields; Optical polarization; Optical pulses; Probes; Tomography;
Conference_Titel :
Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2013 Conference on
Conference_Location :
Kyoto
DOI :
10.1109/CLEOPR.2013.6599947
