DocumentCode :
3053288
Title :
Improved Reliability of Leadfree Flip Chip Assemblies Using Direct Underfilling by Transfer Molding
Author :
Braun, T. ; Wunderle, B. ; Becker, K.-F. ; Koch, M. ; Bader, V. ; Aschenbrenner, R. ; Reichl, H.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin
fYear :
2007
fDate :
8-10 Nov. 2007
Firstpage :
27
Lastpage :
34
Abstract :
Flip Chip technology has been widely accepted within microelectronics as a technology for maximum miniaturization. Transfer molding is the standard process for a highly reliable encapsulation of leaded and area array packages as BGAs or CSPs. Advanced materials and process developments now allow the use of transfer molding technology for direct underfilling and / or overmolding of Flip Chip assemblies. Existing standard equipment for encapsulation can be used and no additional process step for underfill dispensing or jetting is required. Molded Flip Chips have the potential of high reliability as the low CTE of the flip chip molding compound reduces the thermal mismatch. Trends of the market drive towards SIPs with an integration of different devices. Therefore the highly reliable encapsulation of these hybrid packages with inhomogeneous topography is the goal. For testing the reliability limits and the determination of failure mechanism of molded Flip Chips a test vehicle has been designed at Fraunhofer IZM.
Keywords :
ball grid arrays; chip scale packaging; encapsulation; flip-chip devices; integrated circuit reliability; integrated circuit testing; transfer moulding; BGAs; Fraunhofer IZM; area array packages; ball grid arrays; flip chip assemblies overmolding; flip chip molding compound; flip chip molding test vehicle; jetting process; leadfree flip chip assemblies; molded flip chips failure mechanism; package reliability; reliable encapsulation; thermo-mechanical parameters; transfer molding technology; underfill dispensing process; Assembly; Encapsulation; Failure analysis; Flip chip; Microelectronics; Packaging machines; Surfaces; Testing; Transfer molding; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
ISSN :
1089-8190
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2006.4456427
Filename :
4456427
Link To Document :
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