Title : 
Evaluation of concurrent error detection techniques on the Advanced Encryption Standard
         
        
            Author : 
Bousselam, K. ; Di Natale, G. ; Flottes, M. -I ; Rouzeyre, B.
         
        
            Author_Institution : 
LIRMM, Univ. Montpellier II, Montpellier, France
         
        
        
        
        
        
            Abstract : 
In nowadays technologies, circuits are more and more sensitive to aging phenomenon, as well as soft errors. Furthermore several attacks that used a fault to derive secret information have been demonstrated on cryptosystems. Concurrent fault detection is thus of prime interest for such systems. The purpose of this paper is to compare several code-based concurrent fault detection schemes dedicated to the hardware implementation of the Advanced Encryption Standard. The protection schemes under comparison are either directly issued from the literature, or built from several complementary solutions for protection of the full implementation. The evaluation of these schemes is performed in terms of costs with particular emphasis on fault injection vs errors detection capabilities.
         
        
            Keywords : 
cryptography; fault diagnosis; advanced encryption standard; aging phenomenon; code-based concurrent fault detection schemes; concurrent error detection techniques; cryptosystems; errors detection capabilities; fault injection; protection schemes; soft errors; Aging; Circuit faults; Code standards; Computer errors; Cryptography; Electrical fault detection; Fault detection; Hardware; Performance evaluation; Protection; Advanced Encryption Standard; coding techniques; concurrent fault detection;
         
        
        
        
            Conference_Titel : 
Test Symposium (ETS), 2010 15th IEEE European
         
        
            Conference_Location : 
Praha
         
        
        
            Print_ISBN : 
978-1-4244-5834-9
         
        
            Electronic_ISBN : 
1530-1877
         
        
        
            DOI : 
10.1109/ETSYM.2010.5512741