Title :
Test power reduction in compression-based reconfigurable scan architectures
Author :
Almukhaizim, Sobeeh ; Mohammad, Mohammad Gh ; Khajah, Mohammad
Author_Institution :
Comput. Eng. Dept., Kuwait Univ., Safat, Kuwait
Abstract :
We present a method for test power reduction in compression-based reconfigurable scan architectures. In addition to their key objective of minimizing Test Data Volume (TDV), we illustrate how the distribution of care bits in scan chains can be manipulated with the objective of reducing the number of transitions during test. Hence, peak and average power of shift and capture operations are effectively reduced.
Keywords :
reconfigurable architectures; testing; care bits; compression-based reconfigurable scan architectures; scan chains; test data volume; test power reduction; Circuit testing; Computer architecture; Constraint optimization; Cost function; Encoding; Power engineering and energy; Power engineering computing; Statistical analysis; System testing; Systems engineering and theory;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512742
