Title :
Multivariate model for test response analysis
Author :
Krishnan, Shaji ; Kerkhoff, Hans G.
Author_Institution :
Anal. Res. Dept., TNO, Zeist, Netherlands
Abstract :
A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.
Keywords :
VLSI; electronic products; integrated circuit manufacture; integrated circuit testing; VLSI manufacturing; effective multivariate test response model; electronic products; industrial circuit test method; systematic approach; test response analysis; Circuit testing; Electronic equipment testing; Manufacturing industries; Principal component analysis; Production; Radio frequency; Semiconductor device modeling; System testing; Very large scale integration; Virtual manufacturing;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512743
