Title :
Fast simulation based testing of anti-tearing mechanisms for small embedded systems
Author :
Loinig, Johannes ; Steger, Christian ; Weiss, Reinhold ; Haselsteiner, Ernst
Author_Institution :
Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
Abstract :
Small embedded systems are often powered by unreliable power supplies like energy harvesting systems or external power supplies. For secure embedded systems a sudden loss of power can violate data integrity. The power has just to drop when data is written to non-volatile memory. In order to guarantee data integrity, a secure embedded system has to provide an anti-tearing mechanism. In this work we summarize a fast simulation based test method for such mechanisms.
Keywords :
embedded systems; fault simulation; fault tolerant computing; redundancy; antitearing mechanism; data integrity; energy harvesting systems; fast simulation based testing; nonvolatile memory; small embedded system security; unreliable power supplies; Compaction; Embedded system; Java; Performance gain; Power supplies; Power system reliability; Smart cards; System testing; TV; USA Councils;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512751
