DocumentCode :
3053747
Title :
Comparative Simulation Study of GNR-FETs using EHT- and TB-based NEGF
Author :
Zhang, Ming ; Ran, Qiushi ; Guan, Ximeng ; Zhang, Jinyu ; Wang, Yan ; Yu, Zhiping
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing
fYear :
2008
fDate :
9-11 Sept. 2008
Firstpage :
165
Lastpage :
168
Abstract :
A comparative study of graphene nanoribbon MOSFET (GNR-FET) using the extended Huckel theory (EHT) and tight-binding (TB) is conducted within the frame of the self-consistent ballistic non-equilibrium Greenpsilas function (NEGF) formalism. The bandgap variation in armchair-edged GNR (aGNR) induced by the length of the edge bond, as well as the transport characteristics with bond length relaxation, is studied in this paper. A strong structural dependence of aGNR-FET performance on the bond length is also observed and discussed.
Keywords :
EHT calculations; Green´s function methods; MOSFET; bond lengths; energy gap; graphene; tight-binding calculations; C; EHT-based NEGF; TB-based NEGF; armchair-edged GNR; bandgap variation; bond length relaxation; extended Huckel theory; graphene nanoribbon MOSFET; self-consistent ballistic non-equilibrium Greenpsilas function formalism; tight-binding theory; transport characteristics; Bonding; Chemical elements; Computational modeling; Green´s function methods; MOSFET circuits; Nanoscale devices; Orbital calculations; Photonic band gap; Quantum computing; Radio access networks; EHT; NEGF; graphene nanoribbon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
Type :
conf
DOI :
10.1109/SISPAD.2008.4648263
Filename :
4648263
Link To Document :
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