Title :
Impact of Mold Compound Cure Shrinkage on Substrate Block Warpage Simulation
Author :
Lim, Mayhuan ; Yean, Chua Li ; Yeo, Alfred ; Lee, Charles
Author_Institution :
Infineon Technol. Asia Pacific Pte Ltd, Kallang Way
Abstract :
In this paper, four modeling approaches such as InsCTE, MeanCTE, EqvCTE and CureCTE + MeanCTE, were employed to predict the substrate warpage. Both laminate and leadless leadframe substrates were evaluated. The effect of mold compound chemical cure shrinkage on the substrate warpage was also investigated. A laser profilometer was used to measure the warpage of the laminate and leadless leadframe substrates. Our findings show that CureCTE + MeanCTE modeling approach correlates well with the warpage measurement. Therefore, the effect of mold compound chemical cure shrinkage is important and has to be implemented appropriately in the model for accurate warpage predictions. It can also be used in package designs and material selections to eliminate the coplanarity issue and achieve an improved assembly process yield in future developments.
Keywords :
electronics packaging; measurement by laser beam; moulding; chemical cure shrinkage; laser profilometer; material selections; mold compound chemical cure shrinkage; mold compound cure shrinkage; substrate block warpage simulation; substrate warpage measurement; Assembly; Chemical analysis; Chemical compounds; Electronic packaging thermal management; Electronics packaging; Finite element methods; Laminates; Performance analysis; Predictive models; Thermal expansion;
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2006.4456455