DocumentCode
3053831
Title
Impact of Mold Compound Cure Shrinkage on Substrate Block Warpage Simulation
Author
Lim, Mayhuan ; Yean, Chua Li ; Yeo, Alfred ; Lee, Charles
Author_Institution
Infineon Technol. Asia Pacific Pte Ltd, Kallang Way
fYear
2007
fDate
8-10 Nov. 2007
Firstpage
196
Lastpage
201
Abstract
In this paper, four modeling approaches such as InsCTE, MeanCTE, EqvCTE and CureCTE + MeanCTE, were employed to predict the substrate warpage. Both laminate and leadless leadframe substrates were evaluated. The effect of mold compound chemical cure shrinkage on the substrate warpage was also investigated. A laser profilometer was used to measure the warpage of the laminate and leadless leadframe substrates. Our findings show that CureCTE + MeanCTE modeling approach correlates well with the warpage measurement. Therefore, the effect of mold compound chemical cure shrinkage is important and has to be implemented appropriately in the model for accurate warpage predictions. It can also be used in package designs and material selections to eliminate the coplanarity issue and achieve an improved assembly process yield in future developments.
Keywords
electronics packaging; measurement by laser beam; moulding; chemical cure shrinkage; laser profilometer; material selections; mold compound chemical cure shrinkage; mold compound cure shrinkage; substrate block warpage simulation; substrate warpage measurement; Assembly; Chemical analysis; Chemical compounds; Electronic packaging thermal management; Electronics packaging; Finite element methods; Laminates; Performance analysis; Predictive models; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location
Petaling Jaya
ISSN
1089-8190
Print_ISBN
978-1-4244-0730-9
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2006.4456455
Filename
4456455
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