• DocumentCode
    3053873
  • Title

    A software-based self-test methodology for system peripherals

  • Author

    Gross, M. ; Perez, W. J H ; Ravotto, D. ; Sanchez, E. ; Reorda, M. Sonza ; Medina, J. Velasco

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    195
  • Lastpage
    200
  • Abstract
    Software-based self-test strategies have been mainly proposed to tackle microprocessor testing issues, but may also be applied to peripheral testing. However, testing highly embedded peripherals (e.g., DMA or Interrupt controllers) is a challenging task, since their observability and controllability are even more reduced compared to microprocessors and to peripherals devoted to I/O communication (e.g., serial or parallel ports). In this paper we describe an approach to develop functional tests for system peripherals embedded in SoCs that can be used for both design validation and testing. The presented methodology requires two correlated phases: module configuration and module operation. The first one prepares the peripheral on the different operation modes, whereas, the second one is in charge of exciting the whole device and observing its behavior. A methodology for generating suitable test programs is proposed, and preliminary experimental results demonstrating the method effectiveness for an embedded DMA controller are finally reported.
  • Keywords
    file organisation; logic testing; system-on-chip; SoC testing; SoC validation; controllability; microprocessor testing; module configuration phase; module operation phase; observability; peripheral testing; software-based self-test methodology; system peripherals; system-on-chip; Automatic testing; Built-in self-test; Circuit testing; Communication system control; Controllability; Hardware; Microprocessors; Observability; Software testing; System testing; DMA controller; SBST; functional testing; peripherals testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2010 15th IEEE European
  • Conference_Location
    Praha
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4244-5834-9
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETSYM.2010.5512758
  • Filename
    5512758