DocumentCode
3053918
Title
Comprehensive Study of Epoxy Die Attach Process to Achieve Zero Reject Performance
Author
Sinn, Lee Yee ; Eng, Tan Chee
Author_Institution
ON Semicond., Seremban
fYear
2007
fDate
8-10 Nov. 2007
Firstpage
230
Lastpage
235
Abstract
The epoxy die attach is one of the most preferred methods in mounting die on leadframe / substrate, mainly due to its flexibility and cost effectiveness. In a critical package called FETChip, several challenges occurred in the die attach process, due to upset flag/post, flag size smaller than die size, and small gap from flag to post leads. A comprehensive study performed in optimizing epoxy dispensing capability, from determining basic critical conditions, nozzle design, clamp design, idling effect, dispensing parameters, placement, pattern recognition, new machine features, until achieving six sigma process controls in epoxy performance.
Keywords
chip scale packaging; field effect integrated circuits; microassembling; six sigma (quality); FETChip; clamp design; epoxy die attach process; epoxy dispensing capability; leadframe; mounting die; nozzle design; six sigma process controls; substrate; zero reject performance; Assembly; Bonding; Electronics industry; Industrial electronics; Manufacturing processes; Microassembly; Packaging; Semiconductor device manufacture; Six sigma; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location
Petaling Jaya
ISSN
1089-8190
Print_ISBN
978-1-4244-0730-9
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2006.4456459
Filename
4456459
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