• DocumentCode
    3053918
  • Title

    Comprehensive Study of Epoxy Die Attach Process to Achieve Zero Reject Performance

  • Author

    Sinn, Lee Yee ; Eng, Tan Chee

  • Author_Institution
    ON Semicond., Seremban
  • fYear
    2007
  • fDate
    8-10 Nov. 2007
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    The epoxy die attach is one of the most preferred methods in mounting die on leadframe / substrate, mainly due to its flexibility and cost effectiveness. In a critical package called FETChip, several challenges occurred in the die attach process, due to upset flag/post, flag size smaller than die size, and small gap from flag to post leads. A comprehensive study performed in optimizing epoxy dispensing capability, from determining basic critical conditions, nozzle design, clamp design, idling effect, dispensing parameters, placement, pattern recognition, new machine features, until achieving six sigma process controls in epoxy performance.
  • Keywords
    chip scale packaging; field effect integrated circuits; microassembling; six sigma (quality); FETChip; clamp design; epoxy die attach process; epoxy dispensing capability; leadframe; mounting die; nozzle design; six sigma process controls; substrate; zero reject performance; Assembly; Bonding; Electronics industry; Industrial electronics; Manufacturing processes; Microassembly; Packaging; Semiconductor device manufacture; Six sigma; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing and Technology, 31st International Conference on
  • Conference_Location
    Petaling Jaya
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-0730-9
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2006.4456459
  • Filename
    4456459