• DocumentCode
    3053941
  • Title

    Image-Quality-Driven Metrics for Testing and Calibrating ADC Array in CMOS Imagers: A First Step

  • Author

    Chang, Hsiu-Ming ; Cheng, Kwang-Ting ; Huang, Jiun-Lang

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
  • fYear
    2011
  • fDate
    16-18 May 2011
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    CMOS imagers that consist of a pixel array of image sensors, an analog-to-digital converter (ADC) array, and image signal processors (ISPs) have been widely adopted in various imaging applications. Since the array of ADCs in the imager jointly and concurrently converts the pixel data for producing a final image, their test specifications and calibration targets should consider both intra-ADC linearity and inter-ADC uniformity. In this paper, we study the case where an imager has only one ADC so as to evaluate the relationship between the ADC´s static performance values and the resulting image quality. The result provides a foundation toward building effective metrics for correlating intra- and inter-ADC characteristics to the final image quality.
  • Keywords
    CMOS image sensors; analogue-digital conversion; ADC array calibration; CMOS image sensor; analog-to-digital converter array; image-quality-driven metrics; Arrays; CMOS integrated circuits; Histograms; Image quality; Indexes; Noise measurement; application-aware testing; system-aware testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    978-1-4577-1144-2
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2011.13
  • Filename
    6132732