Title :
Image-Quality-Driven Metrics for Testing and Calibrating ADC Array in CMOS Imagers: A First Step
Author :
Chang, Hsiu-Ming ; Cheng, Kwang-Ting ; Huang, Jiun-Lang
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
Abstract :
CMOS imagers that consist of a pixel array of image sensors, an analog-to-digital converter (ADC) array, and image signal processors (ISPs) have been widely adopted in various imaging applications. Since the array of ADCs in the imager jointly and concurrently converts the pixel data for producing a final image, their test specifications and calibration targets should consider both intra-ADC linearity and inter-ADC uniformity. In this paper, we study the case where an imager has only one ADC so as to evaluate the relationship between the ADC´s static performance values and the resulting image quality. The result provides a foundation toward building effective metrics for correlating intra- and inter-ADC characteristics to the final image quality.
Keywords :
CMOS image sensors; analogue-digital conversion; ADC array calibration; CMOS image sensor; analog-to-digital converter array; image-quality-driven metrics; Arrays; CMOS integrated circuits; Histograms; Image quality; Indexes; Noise measurement; application-aware testing; system-aware testing;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4577-1144-2
DOI :
10.1109/IMS3TW.2011.13