DocumentCode :
3053951
Title :
Low-Distortion Single-Tone and Two-Tone Sinewave Generation Algorithms Using an Arbitrary Waveform Generator
Author :
Wakabayashi, Kazuyuki ; Yamada, Takafumi ; Uemori, Satoshi ; Kobayashi, Osamu ; Kato, Keisuke ; Kobayashi, Haruo ; Niitsu, Kiichi ; Miyashita, Hiroyuki ; Kishigami, Shinya ; Rikino, Kunihito ; Yano, Yuji ; Gake, Tatsuhiro
fYear :
2011
fDate :
16-18 May 2011
Firstpage :
33
Lastpage :
38
Abstract :
This paper describes algorithms for generating low distortion single-tone and two-tone sine waves, for testing ADCs,using an arbitrary waveform generator (AWG). The AWG consists of DSP and DAC, and the nonlinearity of the DAC generates distortion components. We propose here to use DSPalgorithms to precompensate for the distortion. The DSP part of the AWG can interleave two or four signals with the same frequency but different phase at the input to the DAC, in order to precompensate for distortion caused by DAC nonlinearity. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of this approach.
Keywords :
analogue-digital conversion; circuit testing; waveform generators; ADC testing; DAC nonlinearity; arbitrary waveform generator; low-distortion single-tone sinewave generation algorithm; low-distortion two-tone sinewave generation algorithm; ADC Testing; Arbitrary Waveform Generator; Digital Pre-distortion; Distortion Shaping; Sinusoidal Signal; Two-Tone Signal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4577-1144-2
Type :
conf
DOI :
10.1109/IMS3TW.2011.17
Filename :
6132733
Link To Document :
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