Title :
Constructing augmented time compactors
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
Abstract :
In this paper, a procedure for constructing time compactors based on a new 3-dimensional augmented product code is presented. Accordingly, augmented time compactors are constructed by assigning a unique triplet <;x, y, z> to each scan chain and calculating at least four sets of parity check bits. Each set of parity check bits is attached to one or more multi-input shift registers (MISRs). The proposed procedure allows an efficient construction for different classes of time compactors as well optimization and comparison of their properties. The constructed augmented time compactors demonstrate an ability to achieve a much higher compaction ratio than convolutional and modular compactors.
Keywords :
combinational circuits; logic gates; logic testing; shift registers; 3-dimensional augmented product code; XOR gates; augmented time compactors; combinational circuits; convolutional compactors; modular compactors; multiinput shift registers; parity check bits; Arithmetic; Circuit testing; Combinational circuits; Compaction; Convolutional codes; Observability; Parity check codes; Product codes; Shift registers; Time measurement;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512767