• DocumentCode
    3054060
  • Title

    Study on the optimized design of nanowire tunneling transistors including quantum effects

  • Author

    Heigl, Alexander ; Wachutka, Gerhard

  • Author_Institution
    Inst. for Phys. of Electrotechnol., Tech. Univ. Munchen, Munich
  • fYear
    2008
  • fDate
    9-11 Sept. 2008
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    To reduce short-channel effects in modern nanoscale MOS devices alternative device concepts like the tunneling field effect transistor have been suggested. Since the complete current is sustained by tunneling processes, these devices obey different design rules than MOSFETs. Similarly, the use of multigate structures is an interesting approach to cope with undesired short-channel effects. A very promising idea is the combination of these two concepts. Using physical device simulation, we investigate the functionality and performance of such nanowire tunneling transistors. Special attention is focussed on the possibility to improve the device performance by considering alternative materials for the gate-stack and the source region.
  • Keywords
    MIS devices; field effect transistors; nanowires; tunnel transistors; MOSFET; gate-stack materials; nanoscale MOS devices; nanowire tunneling transistors; physical device simulation; quantum effects; short-channel effects; Design optimization; FETs; MOSFETs; Nanoscale devices; Numerical simulation; Photonic band gap; Physics; Poisson equations; Potential well; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
  • Conference_Location
    Hakone
  • Print_ISBN
    978-1-4244-1753-7
  • Type

    conf

  • DOI
    10.1109/SISPAD.2008.4648278
  • Filename
    4648278