DocumentCode :
3054060
Title :
Study on the optimized design of nanowire tunneling transistors including quantum effects
Author :
Heigl, Alexander ; Wachutka, Gerhard
Author_Institution :
Inst. for Phys. of Electrotechnol., Tech. Univ. Munchen, Munich
fYear :
2008
fDate :
9-11 Sept. 2008
Firstpage :
225
Lastpage :
228
Abstract :
To reduce short-channel effects in modern nanoscale MOS devices alternative device concepts like the tunneling field effect transistor have been suggested. Since the complete current is sustained by tunneling processes, these devices obey different design rules than MOSFETs. Similarly, the use of multigate structures is an interesting approach to cope with undesired short-channel effects. A very promising idea is the combination of these two concepts. Using physical device simulation, we investigate the functionality and performance of such nanowire tunneling transistors. Special attention is focussed on the possibility to improve the device performance by considering alternative materials for the gate-stack and the source region.
Keywords :
MIS devices; field effect transistors; nanowires; tunnel transistors; MOSFET; gate-stack materials; nanoscale MOS devices; nanowire tunneling transistors; physical device simulation; quantum effects; short-channel effects; Design optimization; FETs; MOSFETs; Nanoscale devices; Numerical simulation; Photonic band gap; Physics; Poisson equations; Potential well; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location :
Hakone
Print_ISBN :
978-1-4244-1753-7
Type :
conf
DOI :
10.1109/SISPAD.2008.4648278
Filename :
4648278
Link To Document :
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