DocumentCode
3054060
Title
Study on the optimized design of nanowire tunneling transistors including quantum effects
Author
Heigl, Alexander ; Wachutka, Gerhard
Author_Institution
Inst. for Phys. of Electrotechnol., Tech. Univ. Munchen, Munich
fYear
2008
fDate
9-11 Sept. 2008
Firstpage
225
Lastpage
228
Abstract
To reduce short-channel effects in modern nanoscale MOS devices alternative device concepts like the tunneling field effect transistor have been suggested. Since the complete current is sustained by tunneling processes, these devices obey different design rules than MOSFETs. Similarly, the use of multigate structures is an interesting approach to cope with undesired short-channel effects. A very promising idea is the combination of these two concepts. Using physical device simulation, we investigate the functionality and performance of such nanowire tunneling transistors. Special attention is focussed on the possibility to improve the device performance by considering alternative materials for the gate-stack and the source region.
Keywords
MIS devices; field effect transistors; nanowires; tunnel transistors; MOSFET; gate-stack materials; nanoscale MOS devices; nanowire tunneling transistors; physical device simulation; quantum effects; short-channel effects; Design optimization; FETs; MOSFETs; Nanoscale devices; Numerical simulation; Photonic band gap; Physics; Poisson equations; Potential well; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices, 2008. SISPAD 2008. International Conference on
Conference_Location
Hakone
Print_ISBN
978-1-4244-1753-7
Type
conf
DOI
10.1109/SISPAD.2008.4648278
Filename
4648278
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