Title :
Cu/Low-k TBGA Glob Top Package Reliability Challenges
Author :
Beng, Lau Teck ; Teck, Siong Chin ; Lee, Chu-Chung Stephen
Author_Institution :
Freescale Semicond., Selangor
Abstract :
Moving into low-k die packaging era, due to much weaker mechanical properties and poorer adhesion of interlayer dielectric, package reliability always poses a challenge to backend assembly process. This is especially critical for the cavity down tape ball grid array (TBGA) package. This paper discusses the approach taken to identify a feasible combination of material set and also the various process and design aspects that are important to lessen the overall package stress exerted onto the low-k die during reliability stress, primarily during temperature cycle test. Series of evaluations were conducted to derive a proven good solution for 44 mum fine pitch wire package and for Pb-free requirement.
Keywords :
assembling; ball grid arrays; copper; low-k dielectric thin films; reliability; TBGA; backend assembly process; glob top package reliability; interlayer dielectric; low-k die; package stress; tape ball grid array package; Adhesives; Assembly; Conducting materials; Dielectric materials; Electronics packaging; Materials reliability; Mechanical factors; Process design; Stress; Temperature;
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2006.4456469