ADC and DAC Testing Using Impulse Signals

This paper analyses qualities of methods for testing dynamical parameters of Analog to Digital and Digital to Analog Converters using impulse signal. Damped Sine Wave signal will be used, as the source for these signals. Furthermore an example of analog realization the damped sine wave signal generator and its qualities are shown in this paper. The results will be compared with Sin Wave FFT test. Results of the tests (like Effective Number of Bits - ENOB, Signal to noise and distortion - SINAD) are evaluated in frequency domain and they are corrected using Crest Factor correction and compared with standard results of Sin Wave FFT test methods.