Title :
Adaptive test directions
Author_Institution :
Aptina Imaging, San Jose, CA, USA
Abstract :
This paper describes the development of adaptive test in response to the ever growing need to dynamically and cost effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of it´s use. Finally, challenges for future development are discussed.
Keywords :
integrated circuit manufacture; integrated circuit testing; statistical analysis; IC testing; adaptive test; manufacturing process variations; statistical data analysis; Costs; Data analysis; Feedforward systems; Integrated circuit testing; Manufacturing processes; Packaging; Performance evaluation; Production; Statistical analysis; Voltage; real-time analysis; statistical data analysis; test flow; variability;
Conference_Titel :
Test Symposium (ETS), 2010 15th IEEE European
Conference_Location :
Praha
Print_ISBN :
978-1-4244-5834-9
Electronic_ISBN :
1530-1877
DOI :
10.1109/ETSYM.2010.5512789
