DocumentCode :
3054569
Title :
Integrated silicon-germanium electronics for CubeSat-based radiometers
Author :
Coen, Christopher T. ; Piepmeier, Jeffrey R. ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2013
fDate :
21-26 July 2013
Firstpage :
1286
Lastpage :
1289
Abstract :
This paper discusses the motivation for and accomplishments to date in our ongoing effort to develop an integrated G-band SiGe radiometer for use in large-scale production of remote sensing CubeSats. The constrained nature of these platforms necessitates the use of highly integrated, low-power electronics that are well-suited for large-scale production, assembly, and testing. The high speeds of emerging 4th-generation SiGe BiCMOS technologies makes these platforms realistic targets for >100 GHz applications for the first time. The high integration level, fabrication economy-of-scale, low 1/f noise, built-in total-dose radiation tolerance, and attractive thermal properties of these technologies make them ideal for this application. Ultra-low noise SiGe LNA designs which show the potential of these technologies for use in high-quality radiometers are presented. Future designs will increase integration levels, with the ultimate goal being a full radiometer-on-a-chip containing calibration sources.
Keywords :
1/f noise; BiCMOS integrated circuits; calibration; geophysical equipment; radiometers; 1/f noise; BiCMOS technologies; CubeSat based radiometers; calibration; economy-of-scale; integrated silicon-germanium electronics; large scale production; low power electronics; radiometer-on-a-chip; remote sensing; total dose radiation tolerance; Fabrication; Heterojunction bipolar transistors; Noise; Radiometers; Receivers; Silicon; Silicon germanium; Silicon germanium; low earth orbit satellites; millimeter wave integrated circuits; radiometers; space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2013 IEEE International
Conference_Location :
Melbourne, VIC
ISSN :
2153-6996
Print_ISBN :
978-1-4799-1114-1
Type :
conf
DOI :
10.1109/IGARSS.2013.6723016
Filename :
6723016
Link To Document :
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