DocumentCode :
3054616
Title :
Generic State Equation fro Dual Core Test Pattern
Author :
Ling, Boey Huey
Author_Institution :
Intel Microelectron. (M) Sdn. Bhd., Penang
fYear :
2007
fDate :
8-10 Nov. 2007
Firstpage :
462
Lastpage :
468
Abstract :
Dual-core multiprocessing designs enable Intel to increase computing performance in an efficient way while keeping the new processor within reasonable power consumption and heat-generation restrictions. State equation is a piece of code that is written in C++. It contains product specific bus decoding logic and understands how to assign data/timing per pin accordingly during test pattern translation. This paper describes the generic design methodology for SE that supports single core, dual-processor testing methodology while remaining extensible enough to support multi-processor design additions in future. This effort has helped enable Intel´s first successful dual core multiprocessing CPU.
Keywords :
C++ language; microprocessor chips; C++; Intel; dual core multiprocessing CPU; dual core test pattern; dual-core multiprocessing designs; generic state equation; product specific bus decoding logic; single core dual-processor testing methodology; test pattern translation; Electronic equipment testing; Equations; Logic testing; Manufacturing; Microelectronics; Packaging; Pins; Semiconductor device testing; Test pattern generators; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
ISSN :
1089-8190
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2006.4456495
Filename :
4456495
Link To Document :
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