• DocumentCode
    3054662
  • Title

    Automated Variant Test Program Generator (Manufacturing Technologies)

  • Author

    Biao, Fong Chii ; Yong, Goh Huan ; Wey, Cham Khang

  • Author_Institution
    Intel Technol. Sdn. Bhd, Bayan Lepas
  • fYear
    2007
  • fDate
    8-10 Nov. 2007
  • Firstpage
    475
  • Lastpage
    480
  • Abstract
    This paper relates to the field of test program generation. The presence of multiple tester platforms in production testing has created a scenario whereby different tools are required to generate the test programs on different tester architecture and complexity. This caused multiple test program development effort, test content inconsistency and divergence. The need for a single tool that can support the multiple different requirements, such as multiple Intel tester libraries on different platforms such as structural, functional, mixed signal or radio frequency testing, new product requirements such as mix signal, multiple cores and high speed digital testing becomes apparent.
  • Keywords
    automatic programming; automatic test software; production engineering computing; automated variant test program generator; high speed digital testing; manufacturing technologies; multiple test program development; radio frequency testing; signal testing; test content inconsistency; tester architecture; Automatic programming; Automatic testing; Computer languages; Engines; Manufacturing automation; Object oriented programming; Production; RF signals; Radio frequency; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing and Technology, 31st International Conference on
  • Conference_Location
    Petaling Jaya
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-0730-9
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2006.4456497
  • Filename
    4456497