DocumentCode :
3054662
Title :
Automated Variant Test Program Generator (Manufacturing Technologies)
Author :
Biao, Fong Chii ; Yong, Goh Huan ; Wey, Cham Khang
Author_Institution :
Intel Technol. Sdn. Bhd, Bayan Lepas
fYear :
2007
fDate :
8-10 Nov. 2007
Firstpage :
475
Lastpage :
480
Abstract :
This paper relates to the field of test program generation. The presence of multiple tester platforms in production testing has created a scenario whereby different tools are required to generate the test programs on different tester architecture and complexity. This caused multiple test program development effort, test content inconsistency and divergence. The need for a single tool that can support the multiple different requirements, such as multiple Intel tester libraries on different platforms such as structural, functional, mixed signal or radio frequency testing, new product requirements such as mix signal, multiple cores and high speed digital testing becomes apparent.
Keywords :
automatic programming; automatic test software; production engineering computing; automated variant test program generator; high speed digital testing; manufacturing technologies; multiple test program development; radio frequency testing; signal testing; test content inconsistency; tester architecture; Automatic programming; Automatic testing; Computer languages; Engines; Manufacturing automation; Object oriented programming; Production; RF signals; Radio frequency; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing and Technology, 31st International Conference on
Conference_Location :
Petaling Jaya
ISSN :
1089-8190
Print_ISBN :
978-1-4244-0730-9
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2006.4456497
Filename :
4456497
Link To Document :
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