DocumentCode :
3054675
Title :
Sensibility, relative error and error probability of projective invariants of planar surfaces of 3D objects
Author :
Sanfeliu, Alberto ; Llorens, Antoni ; Emde, Walter
Author_Institution :
Inst. de Cibernetica, Univ. Politecnica de Cataluna, Barcelona, Spain
fYear :
1992
fDate :
30 Aug-3 Sep 1992
Firstpage :
328
Lastpage :
331
Abstract :
Presents the study of the sensibility, relative error and error probability of projective invariants of planar objects. The study is applied to configurations of groups of five points which define a planar object. The results are general for any type of projective invariant. The paper shows that given the precision (or tolerance) and the maximum allowed error probability, the sensibility and relative error can be used to decide the correct configurations for the matching procedure between the model and the projective view of a physical object. The last result is general for any type of geometric invariant
Keywords :
error statistics; image processing; pattern recognition; probability; 3D object planar surfaces; error probability; error statistics; geometric invariant; pattern recognition; picture processing; projective invariants; relative error; sensibility; Error correction; Error probability; Image processing; Image recognition; Image segmentation; Inspection; Robot sensing systems; Service robots;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1992. Vol.I. Conference A: Computer Vision and Applications, Proceedings., 11th IAPR International Conference on
Conference_Location :
The Hague
Print_ISBN :
0-8186-2910-X
Type :
conf
DOI :
10.1109/ICPR.1992.201568
Filename :
201568
Link To Document :
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