• DocumentCode
    3054675
  • Title

    Sensibility, relative error and error probability of projective invariants of planar surfaces of 3D objects

  • Author

    Sanfeliu, Alberto ; Llorens, Antoni ; Emde, Walter

  • Author_Institution
    Inst. de Cibernetica, Univ. Politecnica de Cataluna, Barcelona, Spain
  • fYear
    1992
  • fDate
    30 Aug-3 Sep 1992
  • Firstpage
    328
  • Lastpage
    331
  • Abstract
    Presents the study of the sensibility, relative error and error probability of projective invariants of planar objects. The study is applied to configurations of groups of five points which define a planar object. The results are general for any type of projective invariant. The paper shows that given the precision (or tolerance) and the maximum allowed error probability, the sensibility and relative error can be used to decide the correct configurations for the matching procedure between the model and the projective view of a physical object. The last result is general for any type of geometric invariant
  • Keywords
    error statistics; image processing; pattern recognition; probability; 3D object planar surfaces; error probability; error statistics; geometric invariant; pattern recognition; picture processing; projective invariants; relative error; sensibility; Error correction; Error probability; Image processing; Image recognition; Image segmentation; Inspection; Robot sensing systems; Service robots;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1992. Vol.I. Conference A: Computer Vision and Applications, Proceedings., 11th IAPR International Conference on
  • Conference_Location
    The Hague
  • Print_ISBN
    0-8186-2910-X
  • Type

    conf

  • DOI
    10.1109/ICPR.1992.201568
  • Filename
    201568