• DocumentCode
    3055114
  • Title

    Graphene containing conductive inks for electrical contacts to power semiconductor devices

  • Author

    Shah, P.B. ; Lettow, J. ; Nyguen, C. ; Derenge, M.A. ; Jones, K.A. ; Batyrev, I. ; Piekarski, B.

  • Author_Institution
    Sensors & Electron Devices Directorate, US Army Res. Lab., Adelphi, MD, USA
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Gallium nitride is one of the materials of choice for high power, high frequency and high temperature applications. However, one key component of GaN transistors and diodes is the Schottky contact and it can create a weakness in the device when high leakage currents occur at small isolated regions containing dislocations. It has been reported that the electron affinity increases at certain defects reducing the Schottky barrier height. [1] The metals used currently as Schottky contacts perform poorly due to their limited range of work functions and pinning of the Fermi level by electronic states at the metal-semiconductor interface. Therefore, we are investigating the use of graphene containing inks produced by Vorbeck Materials for the formation of Schottky contacts. This material is expected to change its electronic characteristics such as the work function based on how it is functionalized. Therefore by coming up with the proper functionalization we may obtain a contact material with very low reverse leakage by increasing the material´s work function. Other benefits that graphene inks would provide as electrical contacts are excellent electrical and thermal conductivity. Results of applying this contact material to silicon and GaN Schottky diodes will be discussed and compared.
  • Keywords
    III-V semiconductors; Schottky barriers; Schottky diodes; electrical contacts; gallium compounds; graphene; leakage currents; power semiconductor devices; silicon; wide band gap semiconductors; Fermi level; Schottky contacts; Schottky diodes; Vorbeck materials; conductive inks; electrical contacts; electronic states; graphene; leakage currents; metal-semiconductor interface; power semiconductor devices; transistors; Conducting materials; Contacts; Gallium nitride; III-V semiconductor materials; Ink; Power semiconductor devices; Schottky barriers; Schottky diodes; Semiconductor materials; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2009. ISDRS '09. International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-6030-4
  • Electronic_ISBN
    978-1-4244-6031-1
  • Type

    conf

  • DOI
    10.1109/ISDRS.2009.5378061
  • Filename
    5378061