• DocumentCode
    305515
  • Title

    Investigation on parallel operations of IGBTs

  • Author

    Yang, Chorng Ho ; Liang, Yung C.

  • Author_Institution
    Taiwan Power Co., Taipei, Taiwan
  • Volume
    2
  • fYear
    1996
  • fDate
    5-10 Aug 1996
  • Firstpage
    1005
  • Abstract
    The investigation of electrical characteristics including the steady-state, small signal and transient analyses for insulated-gate bipolar transistors (IGBTs) used in parallel operation are described in this paper. An algorithm to extract device parameters of the IGBTs for Saber circuit simulator is proposed. Instead of matching the data points on the curves, the algorithm was developed to match the features of I-V characteristic curves, and a great amount of computational effort can be saved. The thermal behaviours were also studied when IGBTs operated at the room temperature or at a higher operating temperature
  • Keywords
    circuit analysis computing; digital simulation; insulated gate bipolar transistors; semiconductor device models; thermal analysis; transient analysis; I-V characteristic curves; IGBT; Saber circuit simulator; features matching; insulated-gate bipolar transistors; parallel operations; room temperature; small signal analysis; steady-state analysis; thermal behaviour; transient analysis; Capacitance; Circuit simulation; Dielectrics and electrical insulation; Electric variables; Insulated gate bipolar transistors; Power electronics; Signal analysis; Steady-state; Transconductance; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1996., Proceedings of the 1996 IEEE IECON 22nd International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    0-7803-2775-6
  • Type

    conf

  • DOI
    10.1109/IECON.1996.566016
  • Filename
    566016