DocumentCode :
305515
Title :
Investigation on parallel operations of IGBTs
Author :
Yang, Chorng Ho ; Liang, Yung C.
Author_Institution :
Taiwan Power Co., Taipei, Taiwan
Volume :
2
fYear :
1996
fDate :
5-10 Aug 1996
Firstpage :
1005
Abstract :
The investigation of electrical characteristics including the steady-state, small signal and transient analyses for insulated-gate bipolar transistors (IGBTs) used in parallel operation are described in this paper. An algorithm to extract device parameters of the IGBTs for Saber circuit simulator is proposed. Instead of matching the data points on the curves, the algorithm was developed to match the features of I-V characteristic curves, and a great amount of computational effort can be saved. The thermal behaviours were also studied when IGBTs operated at the room temperature or at a higher operating temperature
Keywords :
circuit analysis computing; digital simulation; insulated gate bipolar transistors; semiconductor device models; thermal analysis; transient analysis; I-V characteristic curves; IGBT; Saber circuit simulator; features matching; insulated-gate bipolar transistors; parallel operations; room temperature; small signal analysis; steady-state analysis; thermal behaviour; transient analysis; Capacitance; Circuit simulation; Dielectrics and electrical insulation; Electric variables; Insulated gate bipolar transistors; Power electronics; Signal analysis; Steady-state; Transconductance; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control, and Instrumentation, 1996., Proceedings of the 1996 IEEE IECON 22nd International Conference on
Conference_Location :
Taipei
Print_ISBN :
0-7803-2775-6
Type :
conf
DOI :
10.1109/IECON.1996.566016
Filename :
566016
Link To Document :
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