• DocumentCode
    3055304
  • Title

    Insights into the Sensitivity of the BRAIN (Braided Ring Availability Integrity Network)--On Platform Robustness in Extended Operation

  • Author

    Paulitsch, Michael ; Hall, Brendan

  • Author_Institution
    Honeywell Aerosp., Phoenix
  • fYear
    2007
  • fDate
    25-28 June 2007
  • Firstpage
    154
  • Lastpage
    163
  • Abstract
    Low-cost fault-tolerant systems design presents a continual trade-off between improving fault-tolerant properties and accommodating cost constraints. With limited hardware options and to justify the system design rationale, it is necessary to formulate a fault hypothesis to bound failure assumptions. The system must be built on a foundation of real-world relevance and the assumption of coverage of the fault hypothesis. This paper discusses a study that examines the sensitivity of a BRAIN (braided ring availability integrity network) design to different fault types and failure rates in a safety-relevant application. It presents a Markov-based model (using ASSIST, SURE, and STEM analysis tools) and a series of experiments that were run to analyze the overall dependability of the BRAIN approach. The study evaluates the mission reliability and safety in the context of a hypothetical automotive integrated x-by-wire architecture on top of the BRAIN. Drawing from experience in the aerospace domain, the authors investigate the possibility of continued operation for a limited period after a detected critical electronic failure. Continued operation would allow a driver to reach repair facilities rather than stopping the vehicle to call for roadside assistance or "limping home."
  • Keywords
    Markov processes; fault tolerant computing; systems analysis; ASSIST analysis; Markov-based model; STEM analysis; SURE analysis; braided ring availability integrity network; cost constraint; electronic failure; fault-tolerant systems design; Aerospace electronics; Aerospace safety; Automotive engineering; Availability; Brain modeling; Costs; Driver circuits; Fault tolerant systems; Hardware; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks, 2007. DSN '07. 37th Annual IEEE/IFIP International Conference on
  • Conference_Location
    Edinburgh
  • Print_ISBN
    0-7695-2855-4
  • Type

    conf

  • DOI
    10.1109/DSN.2007.60
  • Filename
    4272967