Title :
Enhanced Reliability Modeling of RAID Storage Systems
Author :
Elerath, Jon G. ; Pecht, Michael
Author_Institution :
Network Appliance, Inc., Sunnyvale
Abstract :
A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure follow a homogeneous Poisson process. Separate generalized failure distributions are used to model catastrophic failures and usage dependent data corruptions for each hard drive. Catastrophic failure restoration is represented by a three-parameter Weibull, so the model can include a minimum time to restore as a function of data transfer rate and hard drive storage capacity. Data can be scrubbed as a background operation to eliminate corrupted data that, in the event of a simultaneous catastrophic failure, results in double disk failures. Field-based times to failure data and mathematic justification for a new model are presented. Model results have been verified and predict between 2 to 1,500 times as many double disk failures as that estimated using the current mean time to data loss method.
Keywords :
RAID; Weibull distribution; reliability; system recovery; RAID storage systems; catastrophic failure restoration; double disk failures; generalized failure distributions; hard drive storage capacity; redundant arrays of inexpensive disks; reliability modeling; three-parameter Weibull; usage dependent data corruptions; Data analysis; Drives; Error correction; Hazards; Home appliances; Manufacturing; Mathematical model; Mathematics; Predictive models; Reliability;
Conference_Titel :
Dependable Systems and Networks, 2007. DSN '07. 37th Annual IEEE/IFIP International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
0-7695-2855-4
DOI :
10.1109/DSN.2007.41