Title :
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing
Author :
Nigh, Phil ; Needham, Wayne ; Butler, Ken ; Maxwell, Peter ; Aitken, Rob
fDate :
27 Apr-1 May 1997
Abstract :
This paper describes an experiment in which various semiconductor test methodologies (stuck-fault, functional, delay and IDDq) are applied to an ASIC device. The goal of this project is to provide the data that will enable manufacturers to optimize their application of the various tests. This project was supported through SEMATECH (Project S-121, “Semiconductor Test Method Evaluation ”)
Keywords :
application specific integrated circuits; integrated circuit testing; ASIC device; IDDQ testing; delay-fault testing; functional testing; scan testing; semiconductor testing; stuck-fault testing; Application specific integrated circuits; Collaborative work; Conductors; Costs; Delay effects; Instruments; Integrated circuit testing; Manufacturing; Production; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-8186-7810-0
DOI :
10.1109/VTEST.1997.600334
