Title :
A sample-time error calibration technique in time-interleaved ADCs with correlation-based detection and voltage-controlled compensation
Author :
Yiwen Zhang ; Xiaoshi Zhu ; Chixiao Chen ; Fan Ye ; Junyan Ren
Author_Institution :
State-Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
Sample-time error between channels degrades the resolution of time-interleaved analog-to-digital converters (TIADCs). A calibration method implemented in mixed circuits with low-complexity and fast-convergence is proposed in this paper. The algorithm for detecting sample-time error is based on correlation and widely applied to wide-sense stationary input signals. The detected sample-time error is corrected by a voltage-controlled sampling switch. Experimental result of the 2-channel 200-MS/s 14-bit TIADC shows that the signal-to-noise-and-distortion ratio improves 19.1 dB, and the spurious-free dynamic range improves 34.6 dB for a 70.12-MHz input after calibration. The convergence time of calibration is about 20000 sampling intervals.
Keywords :
analogue-digital conversion; correlation methods; error detection; mixed analogue-digital integrated circuits; correlation-based detection; mixed circuits; sample-time error calibration technique; sample-time error detection; signal-to-noise-and-distortion ratio; time-interleaved ADC; time-interleaved analog-to-digital converters TIADC; voltage-controlled compensation; Calibration; Clocks; Convergence; Correlation; Signal resolution; Switches; Timing;
Conference_Titel :
Circuits and Systems (APCCAS), 2012 IEEE Asia Pacific Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1728-4
DOI :
10.1109/APCCAS.2012.6418988